planarAFM Compact AFM systems for graphene & other materials
planarAFM Compact AFM System for Graphene
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KEY BENEFITS
• Easy operation suitable for non-expert users • User-friendly software with advanced controls • Automatic gain selection for sharper images • Self-height calibration for optimal accuracy • Minimum resolution (mechanical): <0.2nm • Modular design supporting custom features Contact Mode AFM of Graphene Edge on SiO2 Substrate
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planarafm specification
MECHANICAL
• XY-axis nano scanner o 1 module parallel kinematics flexure scanner w/ VCM • Optional PZT o Sample size: up to 50x50mm, up to 15mm thick o Sample weight: up to 700g o Scan range: 100x100um • Optional 50x50um, 200x200um, or 30x30um closed loop o Resolution (mechanical): <0.2nm o Bandwidth: 1kHz • Z-axis nano scanner o PZT driven single module flexure scanner o Scan range: 7um, 15um [optional] o Resolution: <0.02nm (closed loop); <0.01nm (open loop) o Bandwidth: 3kHz • Stage o XY travel range: manual 25x25mm • Optional motorized 30x30mm o Z travel range: 10mm o Z approach: continuous and step-by-step approach • Size and Weight o AFM system: 313(L) x 300(W) x 370(H) mm o Total weight: 18kg o 220V AC Power APPLICATION MODES • Standard modes o Contact o Non-contact o Tapping o Lateral force microscopy (LFM) • Advanced modes [optional] o Force modulation (compliance imaging) o Force-distance spectroscopy o Phase detection o Friction force microscopy (FFM) ACCESSORIES • Pre-mounted contact cantilevers • Pre-mounted non-contact cantilevers • Active vibration isolation table for high precision imaging • Double QPD sensor o For removing PZT nano-scanner artifacts (hysteresis/creep) |
ELECTRONICS
• Optical sensor o Main MCU for Z nano scanner control and imaging: • TMS320F2812 o Sub MCU for peripheral parts: • AT94K10, ATmega8, MSC1211Y3, C8051F067 o High speed 24-bit ADC & 16-bit DAC • 2 channels for control and imaging o High speed 24-bit ADC & 16-bit DAC • 2 channels for control and imaging o High speed 24-bit ADC • 6 channels for application imaging o 16-bit DAC, 4 channels for XY nano scanner o 10-bit ADC, 4 channels for optical alignment o 16-bit ADC 2 channels o 10-bit ADC 4 channels for additional inputs for users o USB 3.0 and RS-232 Interface OPTICAL MICROSCOPE • Direct on-axis vision of sample surface and cantilever o Optical magnification: 300x o Resolution: 1um (0.28 N.A.) o Field of view: 480x360um o Manual focus with 15mm Z travel SOFTWARE • Pre-processing: EZ-AFM o Communication settings o Sensor adjustment and signal monitoring o Application mode selection o Motorized stage control o Nano scanner setup o Controller gain, reference force settings o Cantilever parameters inputs o Calibration • Post-processing: Gwyddion o Image processing: • Flattening, peak removal, contrast enhancement • Filtering in spatial and frequency domains • 3D images o Image analysis and statistics |
planarAFM sample images
standard warranty
Each planarAFM system is delivered with a standard warranty that covers all parts for one (1) year from the date of delivery to the customer site. Any defects in materials or workmanship during the warranty period will be remedied by repair or replacement free of charge.
on-site setup & training
After delivery, planarTECH or its local representative/distributor will send a technical team to the customer site to perform proper installation of the planarAFM system, verification of its operation and a quality check. This installation process typically takes one to two days to complete. After successful setup of the planarAFM system, planarTECH or its local representative/distributor will provide on-site training in the operation and use of the system.
shipping policy
planarTECH ships each planarAFM system to the customer site by Incoterms CIP (Carriage & Insurance Paid) air freight direct from its factory in Korea. The cost of shipping is included in the base price.